TY - JOUR ID - 118038 TI - Computing metric and partition dimension of tessellation of plane by boron nanosheets JO - Eurasian Chemical Communications JA - ECC LA - en SN - 2717-0535 AU - Mohammed, Mohanad Ali AU - Munshid, Ameer J AU - Siddiqui, Hafiz Muhammad Afzal AU - Farahani, Mohammad Reza AD - Department of Mathematics, Open Educational College, Ministry of Education, Al-Qadisiya Centre, Iraq AD - Ministry of Education, Dhi Qar Education Directorate, Iraq AD - Department of Mathematics, COMSATS University Islamabad, Lahore Campus, Lahore, MI, Pakistan AD - Department of Mathematics, Iran University of Science and Technology (IUST), Narmak, 16844, Tehran, Iran Y1 - 2020 PY - 2020 VL - 2 IS - 10 SP - 1064 EP - 1071 KW - Metric dimension KW - partition dimension KW - basis KW - resolving set KW - boron nanotube DO - 10.22034/ecc.2020.251927.1083 N2 - Metric dimension dim(G) and portion dimension pd(G) are usually related as pd(G)≤dim(G)+1. However, if the partition dimension is significantly smaller than the metric dimension, then it is termed as discrepancy. This paper mainly deals with metric dimension and partition dimension of tessellation of plane by boron nanosheets. It has been proved that there is a discrepancy between the mentioned parameters of the boron nanosheets. Moreover, some induced subgraphs of the stated sheets have been considered for the study of their metric dimension. UR - https://www.echemcom.com/article_118038.html L1 - https://www.echemcom.com/article_118038_83f8c89540977f1fcba31bc996c25a1a.pdf ER -