Computing metric and partition dimension of tessellation of plane by boron nanosheets

Mohammed, Mohanad Ali; Munshid, Ameer J; Siddiqui, Hafiz Muhammad Afzal; Farahani, Mohammad Reza

doi:10.22034/ecc.2020.251927.1083

Document Type : Original Research Article

Authors

¹ Department of Mathematics, Open Educational College, Ministry of Education, Al-Qadisiya Centre, Iraq

² Ministry of Education, Dhi Qar Education Directorate, Iraq

³ Department of Mathematics, COMSATS University Islamabad, Lahore Campus, Lahore, MI, Pakistan

⁴ Department of Mathematics, Iran University of Science and Technology (IUST), Narmak, 16844, Tehran, Iran

https://doi.org/10.22034/ecc.2020.251927.1083

Abstract

Metric dimension dim(G) and portion dimension pd(G) are usually related as pd(G)≤dim(G)+1. However, if the partition dimension is significantly smaller than the metric dimension, then it is termed as discrepancy. This paper mainly deals with metric dimension and partition dimension of tessellation of plane by boron nanosheets. It has been proved that there is a discrepancy between the mentioned parameters of the boron nanosheets. Moreover, some induced subgraphs of the stated sheets have been considered for the study of their metric dimension.

Graphical Abstract

Keywords

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Eurasian Chemical Communications

Computing metric and partition dimension of tessellation of plane by boron nanosheets

References

References

Volume 2, Issue 10
October 2020
Pages 1064-1071

Computing metric and partition dimension of tessellation of plane by boron nanosheets

References

References

Volume 2, Issue 10October 2020Pages 1064-1071

Volume 2, Issue 10
October 2020
Pages 1064-1071